Toumi, S. and Ouennoughi, Z. 2024. Temperature-dependent analysis of charge carrier current in Al/SiO2/p-type Si MOS structures with TiN-induced traps via the Poole-Frenkel conduction mechanism using the vertical optimization method. BOHR Journal of Material Sciences and Engineering. 2, 1 (Oct. 2024), 1–12. DOI:https://doi.org/10.54646/bjmse.2024.09.