Toumi, S., and Z. Ouennoughi. “Temperature-Dependent Analysis of Charge Carrier Current in Al/SiO2/P-Type Si MOS Structures With TiN-Induced Traps via the Poole-Frenkel Conduction Mechanism Using the Vertical Optimization Method”. BOHR Journal of Material Sciences and Engineering 2, no. 1 (October 25, 2024): 1–12. Accessed November 22, 2024. https://journals.bohrpub.com/index.php/bjmse/article/view/763.